2. X-ray Photoemission Spectroscopy (XPS) 
XPS is a surface analysis technique and a quantitative  spectroscopic technique that measures the elemental composition, empirical formula, chemical state and electronic state in materials that exist within a material. XPS spectra are  obtained by irradiating a material with a beam of X-rays while  simultaneously measuring the kinetic energy and  number of electrons that escape from the top 1 to 10 nm of the  material being analyzed. XPS requires ultra  high vacuum (UHV) conditions.  | 
  3. X-ray Absorption and Emission Spectroscopy (XAS and XES) 
 Absorption of an X-ray photon promotes an electron from the core level to an  unoccupied state, leaving behind a hole in the core level. XAS thus reveals  information about LUMO levels.  In XES,  an emitted photon is detected when an electron in the occupied valence states  refill a core hole, providing information on the HOMO levels. The use of  resonant XES (RXES) allows also selecting specific atomic species in materials  and probing local energy structure by tuning the incident photon energy to  certain electronic transitions.   | 
  | a)  Left: The ionization potential (IP) and electron affinity (EA) of a gas-phase  molecule with an energy gap E0. Center: Relaxed polaron levels including the  polarization energies EP+ for cations (“hole”) and EP  for anions (“electron”) in  a charged molecule. Right: the optical gap (Eopt) for the neutral excited  molecule. | 
    | 
  In  XAS, a core  electron is excited to the unoccupied states, when X-ray is incident. Here, the  photons measured in XES are produced when  electrons in the occupied states refill the core hole. The energy loss in  RXES typically corresponds to the transitions in which electrons  in the occupied states are scattered to the unoccupied states when excitation  energy is tuned near or on-threshold.  | 
  1. Seo, J. H.; Nguyen, T.-Q. J. Am. Chem. Soc. 2008, 130, 10042. 
2. Seo, J. H.;  Jin,Y.; Brzezinski, J. Z.; Walker, B.; Nguyen, T.-Q. ChemPhysChem 2009, 10, 1023.
3. Braun, S.; Salaneck, W. R.;  Fahlman, M. Adv. Mater. 2009, 21, 1450.
4. Ishii, H.;  Sugiyama, K.; Ito, E.;   Seki, K. Adv. Mater. 1999, 11, 605.
5. J. Hwang, A. Wan, and A. Kahn, Mater. Sci. Eng. R. 2009, 64, 1.
6. http://en.wikipedia.org/wiki/X-ray_photoelectron_spectroscopy
7. http://en.wikipedia.org/wiki/Ultraviolet_photoelectron_spectroscopy  |